HKUST's Prof. Yuan Xie and Collaborators Receive A. Richard Newton Award for Pioneering 3D-Stacked MRAM Research
Prof. Yuan Xie of HKUST and five co-authors have received the 2026 A. Richard Newton Technical Impact Award in Electronic Design Automation at the 63rd Design Automation Conference, recognizing the lasting impact of their 2008 DAC paper on 3D-stacked MRAM as a universal memory replacement.
































